Lars Martin S Aas, Ingar Stian Nerbø, Morten Kildemo, Daniele Chiappe, Christian Martella, Francesco Buatier De Mongeot
Biblio references: Volume: 8082 Pages: 80822W
Origin: Optical Measurement Systems for Industrial Inspection VII
Federico Nardi, Carlo Cagli, D Ielmini, S Spiga
Biblio references: Pages: 1-4
Origin: 2011 3rd IEEE International Memory Workshop (IMW)
A Belardini, MC Larciprete, M Centini, E Fazio, C Sibilia, D Chiappe, C Martella, A Toma, F Buatier de Mongeot
Biblio references: Pages: EF2_4
Origin: European Quantum Electronics Conference
