MARCO FANCIULLI, OMAR COSTA, SILVIA BALDOVINO, SIMONE COCCO, GABRIELE SEGUINI, ENRICO PRATI, GIOVANNA SCAREL
Biblio references: Pages: 263-276
Origin: Defects in High-k Gate Dielectric Stacks
R Mantovan, S Spiga, M Fanciulli
Biblio references: Pages: 69-73
Origin: ICAME 2005
HP Gunnlaugsson, K Bharuth-Ram, M Dietrich, M Fanciulli, HOU Fynbo, G Weyer
Biblio references: Pages: 1315-1318
G Weyer, Haraldur Pall Gunnlaugsson, K Bharuth-Ram, M Dietrich, R Mantovan, V Naicker, D Naidoo, R Sielemann
Biblio references: Pages: 417-421
Origin: HFI/NQI 2004
E Bonera, M Fanciulli
Biblio references: Pages: 371-374
Origin: Microscopy of Semiconducting Materials
M Ilie, L NARDI, V FOGLIETTI, E CIANCI, F Scarinci, A MINOTTI
Biblio references: Pages: 72-77
Origin: Sensors And Microsystems
G Scarel, M Fanciulli
Biblio references: Pages: 31-38
Origin: Materials for Information Technology
G Tallarida, S Spiga, M Fanciulli
Biblio references: Pages: 405-411
Origin: Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
J MALY, M ILIE, V FOGLIETTI, E CIANCI, A MINOTTI, B LANZA, A MASCI, W VASTARELLA, R PILLOTON
Biblio references: Pages: 8-13
