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Type: 
Conference
Description: 
Article PreviewArticle PreviewArticle PreviewPhase change memories (PCM) are typically based on compounds of the Ge-Sb-Te (GST) ternary system. Nevertheless, a major drawback of PCM devices based on GST is the low crystallization temperature, which prevents the fulfillment of automotive-level or military-grade requirements (125 C continuous operation). To overcome this limitation, alloys belonging to the In-Sb-Te (IST) system have been proposed, which have demonstrated high crystallization temperature, and fast switching. Thermal properties of the chalcogenide alloy and of its interfaces within the PCM cell are key parameters versus the programming current, reliability and optimized scaling of PCM devices. The Modulated Photothermal Radiometry (MPTR) technique was implemented to measure the thermal conductivity of IST thin films as well as the thermal boundary resistance at the interface with …
Publisher: 
Trans Tech Publications
Publication date: 
1 Jan 2014
Authors: 

Huu Tan Nguyen, Andrzej Kusiak, Jean Luc Battaglia, Cecile Gaborieau, Yanick Anguy, Roberto Fallica, Claudia Wiemer, Alessio Lamperti, Massimo Longo

Biblio References: 
Volume: 95 Pages: 113-119
Origin: 
Advances in Science and Technology